Special Recognitions


  • EE Times Article "Dispelling the myth about analog scaling", based on ISSCC 2012 paper, Feb 2012.
  • EE Times Article "Intel details Sandy Bridge at ISSCC", based on a ISSCC 2011 Paper, Feb, 2011.
  • SBIR Program" 6H-SiC Pressure Sensors for High Temperature Applications"  was listed as an "SBIR Success Story"- 1996.
  • NASA Certificate of Recognition for "Making SiC Semiconductor Devices Containing Porous Regions"- included in NASA Tech Briefs, 1996, based on SBIR Program.
  • Trade Journal Note - "Porous SiC Expected to Yield Innovative Devices" in Technology Newsletter - "Electronic Design", Oct 24, 1996.
  • Trade Journal Note – "6H SiC Pressure Sensors aim for High Temperature Operation at up to 600C" in Technology Breakthrough Section, "Electronic Design", Jan 6, 1997, based on SBIR.
  • EE Times Article "Single chip answers base-station needs" – highlight from ICSPAT '96, Oct 17, 1996.
  • Recipient of Kulite Scholarship – 1990 –Columbia University and Kulite Semiconductor.
  • Paul Klapper Physics Prize – Queens College of CUNY, 1986