{"id":39,"date":"2015-08-02T11:06:04","date_gmt":"2015-08-02T08:06:04","guid":{"rendered":"http:\/\/www.eng.biu.ac.il\/shorjos\/?page_id=39"},"modified":"2026-02-03T12:12:22","modified_gmt":"2026-02-03T10:12:22","slug":"publications","status":"publish","type":"page","link":"https:\/\/www.eng.biu.ac.il\/shorjos\/publications\/","title":{"rendered":"Publications"},"content":{"rendered":"

Journal Papers<\/b><\/p>\n

Google Citations<\/a>\u00a0<\/strong><\/p>\n

    \n
  1. \n

    A. Feldman and J. Shor, \"A 0.0106 mm2<\/sup> 8nW Resistor-Less BJT Bandgap Reference Circuit in 65 nm CMOS With Orthogonal Voltage and Temperature Coefficient Trims,\" in\u00a0IEEE Transactions on Circuits and Systems I: Regular Papers<\/i>, vol. 73, no. 1, pp. 60-72, Jan. 2026.<\/p>\n<\/li>\n

  2. \n

    Elisheva Berkowitz, Yosi Greenblatt, Claudio G. Jakobson, Adam Teman, Joseph Shor, \u201cA cryogenic 2T GC-eDRAM with an Inverter Based Readout scheme and an 80ms Retention time\u201d, accepted to IEEE Transactions on VLSI, 2026.<\/p>\n<\/li>\n

  3. Feldman and J. Shor<\/strong>, \"A 0.0106 mm2<\/sup> 8nW Resistor-Less BJT Bandgap Reference Circuit in 65 nm CMOS With Orthogonal Voltage and Temperature Coefficient Trims,\" in\u00a0IEEE Transactions on Circuits and Systems I: Regular Papers<\/em>, Early Access, 2025.<\/li>\n
  4. I. Shpernat, A. Feldman and J. Shor<\/strong>, \"A Fully Integrated 5510-\u03bcm\u00b2 Process Monitor and Threshold Voltage Extractor Circuit in 28 nm,\" in\u00a0IEEE Solid-State Circuits Letters<\/em>, vol. 7, pp. 279-282, 2024.<\/li>\n
  5. E. Emanovi\u0107, D. Juri\u0161i\u0107 and J. Shor<\/strong>, \"A Fully Integrated, Switched-Capacitor DC\u2013DC Buck Converter Featuring an Inverter-Based Comparator,\" in\u00a0IEEE Access<\/em>, vol. 12, pp. 86425-86433, 2024.<\/li>\n
  6. Y. Shifman and J. Shor<\/strong>, \u201cAn 11uW, 0.08 mm2<\/sup> , 125dB-Dynamic-Range Current-Sensing Dynamic CT Zoom ADC\u201d, accepted for publication in IEEE Transactions on Circuits and Systems I<\/em>, 2024.<\/li>\n
  7. D. Zagouri, A. Rimer, E. Emanovic, Y. Ninio, Y. Slezak, D. Jurisic, A. Fish and J. Shor<\/strong>,\u00a0 \"A Photovoltaic Energy Harvester\/Image Sensor Platform With Event Detection Capability in 180 nm,\" in\u00a0IEEE Solid-State Circuits Letters<\/em>, vol. 7, pp. 62-65, 2024<\/li>\n
  8. A. Feldman, O. Nechushtan and J. Shor<\/strong>, \"Voltage Level Detection for Near-VTH Computing,\" in\u00a0IEEE Journal of Solid-State Circuits<\/em>, vol. 59, no. 6, pp. 1847-1857, June 2024<\/li>\n
  9. O. Bass, A. Feldman and J. Shor<\/strong>, \"A Resistor-Less nW-Level Bandgap Reference With Fine-Grained Voltage and Temperature Coefficient Trims<\/a>,\" in\u00a0IEEE Open Journal of Circuits and Systems<\/em>, vol. 3, pp. 192-198, 2022.<\/li>\n
  10. Y. Shifman and J. Shor<\/strong>, \"Preselection Methods to Achieve Very Low BER in SRAM-Based PUFs -A Tutorial<\/a>,\" in\u00a0IEEE Transactions on Circuits and Systems II: Express Briefs<\/em>, vol. 69, no. 6, pp. 2551-2556, June 2022.<\/li>\n
  11. Y. Lempel, R. Breuer and J. Shor<\/strong>, \u201cA 700-\u03bcm\u00b2, Ring-Oscillator-Based Thermal Sensor in 16-nm FinFET<\/a>,\u201din\u00a0 IEEE Transactions on Very Large Scale Integration (VLSI) Systems<\/em>, vol. 30, no. 2, pp. 248-252, Feb. 2022.<\/li>\n
  12. Y. Shifman, I. Stanger, N. Shavit, R. Taco, A. Fish and J. Shor<\/strong>, \u201cA Method for Mitigation of Droop Timing Errors Including a 500MHz Droop Detector and Dual Mode Logic<\/a>\u201d, in IEEE Journal of Solid-State Circuits<\/em>, vol. 57, no. 2, pp. 596-608, Feb. 2022.<\/li>\n
  13. A. Mizrahi, Y. Shifman and J. Shor<\/strong>, \"A 8800 \u03bcm\u00b2 CCO-Based Voltage-Droop and Temperature Detector in 65 nm<\/a>,\" in IEEE Access<\/em>, vol. 9, pp. 114435-114440, 2021.<\/li>\n
  14. Invited Paper<\/span> : J. Shor, <\/strong>\"Compact Thermal Sensors for Dense CPU Thermal Monitoring and Regulation - A Review<\/a>\"\u00a0 in\u00a0IEEE Sensors Journal<\/em>, vol. 21, no. 11, pp. 12774-12788, June 2021.<\/li>\n
  15. L. Lisha, O. Bass and J. Shor<\/strong>, \"A 5800 \u03bcm2 Process Monitor Circuit for Measurement of in-die Variation of Vth in 65nm<\/a>\u201d, in\u00a0IEEE Transactions on Circuits and Systems II: Express Briefs<\/em>, vol. 68, no. 3, pp. 863-867, March 2021.<\/li>\n
  16. Y. Shifman, A. Miller, O. Keren, Y. Weizman and J. Shor<\/strong>, \"A Method to Utilize Mismatch Size to Produce an Additional Stable Bit in a Tilting SRAM-Based PUF<\/a>\" in\u00a0IEEE Access<\/em>, vol. 8, pp. 219137-219150, 2020.<\/li>\n
  17. Y. Shifman, A. Miller, Y. Weizman and J. Shor<\/strong>, \"A 2 Bit Cell Tilting SRAM-Based PUF with a BER of 3.1e-10 and an Energy of 21 fj bit in 65nm<\/a>\" in\u00a0 IEEE Open Journal of Circuits and Systems<\/em>, vol. 1, pp. 205-217, 2020.\u00a0<\/em><\/li>\n
  18. A. Feldman and J. Shor<\/strong>, \"An Accurate 0.55V 2.6uW Voltage Level Detector<\/a>\", in\u00a0IEEE Solid-State Circuits Letters<\/em>, vol. 3, pp. 166-169, 2020.<\/li>\n
  19. O. Bass and J. Shor<\/strong>, \u201cA Charge Balancing 1450 um2<\/sup> PNP Based Thermal Sensor for Dense Thermal Monitoring<\/a>\u201d in\u00a0IEEE Transactions on Circuits and Systems II: Express Briefs<\/em>, vol. 67, no. 12, pp. 2963-2967, Dec. 2020.<\/li>\n
  20. Y. Shifman, A. Miller, O. Keren, Y. Weizman, and J. Shor<\/strong>, \"An SRAM-Based PUF with a Capacitive Digital Preselection for a 1E-9 Key Error Probability<\/a>\" in\u00a0IEEE Transactions on Circuits and Systems I: Regular Papers<\/em>, vol. 67, no. 12, pp. 4855-4868, Dec. 2020.<\/li>\n
  21. N. Vinshtok-Melnik and J. Shor<\/strong>, \"Ultra Miniature 1850\u03bcm2 Ring Oscillator Based Temperature Sensor,<\/a>\" in IEEE Access, <\/em>vol. 8,\u00a0 pp. 91415-91423,<\/em> May 2020.<\/em><\/li>\n
  22. O. Bass and J. Shor<\/strong>, \"<\/a>A Miniaturized 0.003 mm\u00b2 PNP-Based Thermal Sensor for Dense CPU Thermal Monitoring,<\/a>\"<\/a> in IEEE Transactions on Circuits and Systems I: Regular Papers<\/em>, vol 67, no. 9, pp. 2984-2992, Sept. 2020.<\/li>\n
  23. Y. Shifman, A. Miller, Y. Weizman, O. Keren and J. Shor<\/strong>, \"A Method to Improve Reliability in a 65nm SRAM PUF Array<\/a>\"\u00a0 in IEEE Solid-State Circuits Letters<\/em>, vol. 1, no. 6, pp. 138-141, June 2018.<\/li>\n
  24. A. Mordakhay, J. Shor<\/strong> - \"Miniaturized, 0.01 mm\u00b2, Resistor-Based Thermal Sensor With an Energy Consumption of 0.9 nJ and a Conversion Time of 80 \u03bcs for Processor Applications<\/a>\" in IEEE Journal of Solid-State Circuits<\/em>, vol. 53, no. 10, pp. 2958-2969, Oct. 2018.<\/li>\n
  25. U. Zangi, N. Feldman, T. Hadas, N. Dayag, J. Shor<\/strong>, A. Fish, \"0.45 v and 18 \u03bcA\/MHz MCU SOC with Advanced Adaptive Dynamic Voltage Control (ADVC)<\/a>\", in Journal of Low Power Electronics and Applications<\/em> 8 (2), 14, S3S Special Issue (2018<\/strong>)<\/li>\n
  26. A. Mordakhay, Y. Telepinsky, L. Klein, J. Shor<\/strong>, A. Fish, \"A Low Noise Low Offset Readout Circuit for Magnetic-Random-Access-Memory<\/a>\",\u00a0 in IEEE Transactions on Circuits and Systems I: Regular Papers<\/em>,\u00a0 65 (4), 1224-1233 (2018)<\/li>\n
  27. K.A. Bowman, M.M. Khellah, T. Kono, J. Shor<\/strong>, P.I. Mak, \"Introduction to the January Special Issue on the 2017 IEEE International Solid-State Circuits Conference<\/a>\", in IEEE Journal of Solid-State Circuits<\/em> 53 (1), 3-7<\/li>\n
  28. J. Shor<\/b> and D. Zilberman, \"An Accurate Bandgap-Based Power-On-Detector for Microprocessors in 14nm CMOS<\/a>\" ,\u00a0 in IEEE Transactions on Circuits and Systems II: Express Briefsvol<\/em> vol. 63, no. 5, pp. 428-433 (2016<\/strong>)<\/li>\n
  29. K. Luria, J. Shor<\/strong>, M. Zelikson, and A. Lyakhov, \"Dual-Mode Low-Drop-Out Regulator\/Power Gate With Linear and On\u2013Off Conduction for Microprocessor Core On-Die Supply Voltages in 14 nm<\/a>\", in IEEE Journal of Solid-State Circuits<\/em> vol 51, no. 3, pp 752 - 762 (2016<\/strong>)<\/li>\n
  30. T. Oshita, J. Shor<\/strong>, D. E. Duarte, A. Kornfeld, G. L. Geannopoulos, J. Douglas, and N. Kurd, \"A Compact First-Order \u03a3\u0394 modulator for Analog High-Volume Testing of Complex System-on-Chips in a 14 nm Tri-Gate Digital CMOS Process<\/a>\", in IEEE Journal of Solid-State Circuits<\/em> vol. 51, no. 2 pp. 378 - 390 (2016<\/strong>)<\/li>\n
  31. T. Oshita, J. Shor<\/strong><\/b>, D. E. Duarte, A. Kornfeld, D. Zilberman, \"Compact BJT-Based Thermal Sensor for Processor Applications in a 14 nm tri-Gate CMOS Process<\/a>\", in IEEE Journal of Solid-State Circuits<\/em>, vol 50,3, pp. 799-807 (2015<\/strong>)<\/li>\n
  32. J. Shor<\/strong> and K. Luria, \" Miniaturized BJT-Based Thermal Sensor for Microprocessors in 32-and 22-nm Technologies<\/a>\", in IEEE Journal of Solid State Circuits<\/i>, Nov 2013<\/b>, pp 2860-2867 (2013<\/b>)\u00a0<\/a><\/li>\n
  33. M. Yuffe, M. Mehalel, E. Knoll, J. Shor<\/strong>, T. Kurts, E. Altshuler, E. Fayneh, K. Luria, and M. Zelikson \"A Fully Integrated Multi-CPU, Processor Graphics, and Memory Controller 32-nm Processor<\/a>\" in IEEE Journal of Solid State Circuits<\/i>, JSSC Jan 2012 pp. 194-206 - ISSCC Special Issue invited (2012)\u00a0<\/b><\/li>\n
  34. J. Shor<\/strong>, A.D. Kurtz, I. Grimberg, B.Z. Weiss, and R.M. Osgood, \"Dopant Selective Etch Stops in 6H and 3C SiC<\/a>\", in Journal of Applied Physics<\/i> 81,3 (1997).<\/li>\n
  35. J. Shor<\/strong>, L. Bemis, A.D. Kurtz, I. Grimberg, B.Z. Weiss, M.F. Macmillan and W.J. Choyke, \u201cCharacterization of Nanocrystallites in Porous P-type 6H-SiC<\/a>\u201d, Journal of Applied Physics<\/i> 76, 4045 (1994).<\/li>\n
  36. J. L. Davidson, J. Shor<\/strong>, D. Wur and A.D. Kurtz, \u201cDiamond Resistors Fabricated Monolithically on Diamond Film Substrate<\/a>\u201d, in J. Electrochem. Soc.<\/i> 141, 3522 (1994)\u00a0<\/a><\/li>\n
  37. J. Shor<\/strong>, L. Bemis and A.D. Kurtz, \"Characterization of Monolithic n-type 6H-SiC Piezoresistive Sensing Elements<\/a>\", in IEEE Trans. Electron Devices<\/i>, 41 , 661 (1994).\u00a0<\/a><\/li>\n
  38. J. Shor<\/strong>, R. A. Weber, L. G. Provost, D. Goldstein and A. D. Kurtz, \"High Temperature Ohmic Contact Metallizations for n-type 3C-SiC<\/a>\", in Journal of the Electrochemical Society<\/i> 141, 579 (1994).<\/li>\n
  39. J. Shor<\/strong> and A. D. Kurtz, \"Photoelectrochemical Etching of 6H-SiC<\/a>\" , in Journal of the Electrochemical Society<\/i>\u00a0141, 778 (1994).<\/li>\n
  40. J. Shor<\/strong>, D. Goldstein and A.D. Kurtz, \"Characterization of n-type beta-SiC as a Piezoresistor<\/a>\", in\u00a0 IEEE Transactions on Electron Devices<\/i> 40, 1093 (1993).<\/li>\n
  41. J. Shor<\/strong>,<\/b> I. Grimberg, B.Z. Weiss, and A.D. Kurtz, \"Direct Observation of Porous SiC Formed by Anodization in HF<\/a>\",in Applied Physics Letters<\/i> 62, 2836 (1993).<\/li>\n
  42. J. Shor<\/strong> and R.M. Osgood Jr., \"Broad Area Photoelectrochemical Etching of SiC<\/a>\", in Journal of Electrochemical Society <\/i>140, L123 (1993).<\/li>\n
  43. J. Shor<\/strong>, X.G. Zhang and R.M. Osgood, \"Laser Assisted Photoelectrochemical Etching of n-type beta-SiC<\/a>\", in Journal of the Electrochemical Socie<\/i>ty, 139, 1213 (May 22, 1992).<\/li>\n
  44. J. Shor<\/strong>, R.M. Osgood and A.D. Kurtz, \"Photoelectrochemical Conductivity Selective Etch Stops in SiC<\/a>\", in Applied Physics Letters<\/i> 60, 1001 (1992).<\/li>\n<\/ol>\n

    Papers in Top Solid State Circuit Conferences<\/b><\/p>\n

      \n
    1. \n

      E. Berkowitz, Y. Atias, A. Baron, Y. Weizman, I. Levi and J. Shor, \u201cA Reference-Less Inverter-Amplifier Based Programmable Laser Attack Sensor with 30mV Sensitivity\u201d accepted to 2026 IEEE Custom Integrated Circuits Conference (CICC).<\/p>\n<\/li>\n

    2. \n

      O. Nechushtan, A. Feldman and J. Shor, \"A 385mV, 270nW, Accurate Voltage Level Detector for IoT,\"\u00a0ESSCIRC 2022<\/u>- IEEE 48th European Solid State Circuits Conference (ESSCIRC)<\/i>, Milan, Italy, 2022, pp. 369-372.<\/p>\n<\/li>\n

    3. A. Feldman and J. Shor<\/strong>, \"A 0.0106 mm2 8nW Resistor-Less BJT Bandgap Reference in 65nm,\"\u00a0<\/a>ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC)<\/em>, Lisbon, Portugal, 2023, pp. 85-88, doi: 10.1109\/ESSCIRC59616.2023.10268740.<\/li>\n
    4. O. Nechushtan, A. Feldman and J. Shor<\/strong>, \u201cA 385mV, 270nW, Accurate Voltage Level Detector for IoT<\/a>\u201d, accepted to the European Solid State Circuits Conference<\/em>, ESSCIRC 2022.<\/li>\n
    5. E. Emanovi\u0107, J. Shor and D. Juri\u0161i\u0107, \"An Inverter-Based, Ultra-Low Power, Fully Integrated, Switched-Capacitor DC-DC Buck Converter,<\/a>\" ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC)<\/em>, 2021, pp. 359-362.<\/li>\n
    6. A. Miller*, Y. Shifman*, Y. Weizman, O. Keren and J. Shor<\/strong>, \"A Highly Reliable SRAM PUF with a Capacitive Preselection Mechanism and pre-ECC BER of 7.4E-10<\/a>\" 2019 IEEE Custom Integrated Circuits Conference (CICC)<\/em>, 2019, pp. 1-4.<\/li>\n
    7. O. Bass and J. Shor<\/strong> \"Ultra-Miniature 0.003 mm2 PNP-Based Thermal Sensor for CPU Thermal Monitoring<\/a>\", ESSCIRC 2018 - IEEE 44th European Solid State Circuits Conference (ESSCIRC)<\/em>, 2018, pp. 334-337.<\/li>\n
    8. K. Luria, J. Shor<\/strong>, M. Zelikson, A. Lyakhov, \"Dual-use low-drop-out regulator\/power gate with linear and on-off conduction modes for microprocessor on-die supply voltages in 14nm<\/a>\", IEEE International Solid- State Circuits Conference<\/em>, Digest of Technical Papers, ISSCC 2015,\u00a0in\u00a0IEEE Journal of Solid-State Circuits<\/em>, vol. 51, no. 3, pp. 752-762, March 2016.<\/li>\n
    9. J. Shor<\/b>, K. Luria and D. Zilberman, \"Ratiometric BJT-based Thermal Sensor in 32nm and 22nm Technologies<\/a>\", International Solid State Circuits Conference<\/i>- ISSCC , 2012<\/i> - <\/b>Digest of Technical Papers, pp.210.<\/li>\n
    10. M. Yuffe, M. Mehalel, E. Knoll, J. Shor<\/strong><\/b>, T. Kurts, \"A Fully Integrated Multi-CPU, GPU and Memory Controller 32nm Processor<\/a>\",\u00a0in\u00a0IEEE Journal of Solid-State Circuits<\/em>, vol. 47, no. 1, pp. 194-205, Jan. 2012.<\/li>\n
    11. E. Maayan, R. Dvir, J. Shor<\/strong><\/b>, Y. Polansky, Y. Sofer, I. Bloom, D. Avni, B. Eitan, Z. Cohen, M. Meyassed, Y. Alpern, H. Palm, E. Stein, P. Halibach, D. Caspary, S. Reidel, and R. Knofler, \u201cA 512Mb NROM Flash Data Storage Memory with 8MB\/s Data rate<\/a>\u201d, \u00a02002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315)<\/em>, 2002, pp. 100-101 vol.1<\/li>\n
    12. J. Shor<\/strong>, Y. Afek and E. Engel, \"IO Buffer for High Performance, Low Power Application<\/a>\", Proceedings of CICC 97 - Custom Integrated Circuits Conference<\/em>, 1997, pp. 595-598.<\/li>\n<\/ol>\n

      Papers Presented and Published in Refereed International Conferences<\/b><\/p>\n

        \n
      1. Jog, A. Gupta, A. Shapira, Y. Shifman, P. Tandeitnik, J. Shor<\/strong> and Y. Shacham-Diamand, in \"Verilog-A Modelling of Electrochemical Sensors for Combined Simulation of Biosensors and Interfaces,\"\u00a02024 IEEE SENSORS<\/em>, Kobe, Japan, 2024, pp. 1-4<\/li>\n
      2. Barron, J. Shor and I. Levi, \"Comparative Evaluation of Sensors for Active Adversaries by Laser Fault Injection Detection,\" 2024 IEEE International Conference on Microwaves, Communications, Antennas, Biomedical Engineering and Electronic Systems (COMCAS), Tel Aviv, Israel, 2024, pp. 1-5.<\/li>\n
      3. Y. Shifman and J. Shor<\/strong>, \u201cMirrorN <\/sup>PUF: Harvesting Multiple Independent Bits From Each PUF Cell in 65nm\u201d, in 2022 IEEE International Symposium on Circuits and Systems (ISCAS)<\/em>, 2022.<\/li>\n
      4. D. Zagouri and J. Shor<\/strong>, \"A Subthreshold Voltage Reference with Coarse-Fine Voltage Trimming<\/a>,\" \u00a02021 IEEE International Symposium on Circuits and Systems (ISCAS)<\/em>, 2021, pp. 1-4.<\/li>\n
      5. Y. Shifman*, A. Miller*,\u00a0 Y. Weizman,\u00a0 and J. Shor <\/strong>\"An SRAM PUF with 2 Independent Bits\/Cell in 65nm<\/a> ,<\/u>\"<\/em><\/strong> 2019 IEEE International Symposium on Circuits and Systems (ISCAS)<\/em>, Sapporo, Japan, 2019, pp. 1-5.<\/li>\n
      6. N. Vinshtok-Melnik, R. Giterman, J. Shor<\/strong>, \"<\/a>Ultra Miniature Offset Cancelled Bandgap Reference with \u00b10. 534% Inaccuracy from -10\u00b0C to 110\u00b0C<\/a>\"<\/a>, 2017 IEEE International Symposium on Circuits and Systems (ISCAS)<\/em>, 2017, pp. 1-4.<\/li>\n
      7. Zangi, N. Feldman, J. Shor<\/strong> and A. Fish, \u201c<\/a>0.45v and 18\u03bcA\/MHz MCU SOC with Advanced Adaptive Dynamic Voltage Control (ADVC)<\/a>\u201d<\/a>, 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)<\/em>, 2017, pp. 1-2.<\/li>\n
      8. O. Bass and J. Shor<\/strong>, \"Ultra Miniature, 10 bit, First Order Sigma Delta\u00a0Modulator with improved PSRR\", presented at the 2016 IEEE 28th Convention of Electrical and Electronics Engineers<\/em> in Israel, Nov, 2016.<\/li>\n
      9. J. Shor<\/strong> and K. Luria, \"<\/a>Evolution of Thermal Sensors in Intel Processors from 90nm to 22nm<\/a>\"<\/a>, 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel<\/em>, 2012, pp. 1-5.<\/li>\n
      10. J. Shor<\/strong>, \"<\/a>Low Noise Linear Voltage Regulator for Use as an on-chip PLL Supply in Microprocessors<\/a>\"<\/a>, Proceedings of 2010 IEEE International Symposium on Circuits and Systems<\/em>, 2010, pp. 841-844.<\/li>\n
      11. K. Luria and J. Shor<\/strong>, \"Miniaturized CMOS Thermal Sensor Array for Temperature Gradient Measurement in Microprocessors<\/a>\", \u00a0Proceedings of 2010 IEEE International Symposium on Circuits and Systems<\/em>, 2010, pp. 1855-1858.<\/li>\n
      12. J. Shor<\/strong>, \"Voltage Regulator Circuits for Low-Jitter PLL\u2019s with High PSSR (>40dB) in a Purely Digital 65nm Process\", in IEEE COMCAS<\/i>, Tel Aviv, Israel, 2008<\/li>\n
      13. J. Shor, <\/strong>Y. Polansky, Y. Sofer, E. Maayan,\u00a0 \"Self-regulated four-phased charge pump with boosted wells<\/a>\", Proceedings of the 2003 International Symposium on Circuits and Systems, 2003. ISCAS '03.<\/em>, 2003, pp. I-I.<\/li>\n
      14. J. Shor<\/strong>, Y. Sofer, Y. Polansky, and E. Maayan, \u201cLow Power Voltage Regulator For EPROM Applications<\/a>\u201d ISCAS 2002: International Symposium on Circuits and Systems<\/i>, May 26-29, 2002, Phoenix Arizona.<\/li>\n
      15. V. Koifman, Y. Afek and J. Shor<\/strong><\/b>; \u201cCircuit Methods for the Integration of Low Voltage (1.1-1.8V) Analog Functions on System-on-a-Chip IC\u2019s in a Single Poly CMOS Process<\/a>\u201d Proceedings of ISLPED 99: International Symposium on Low Power Electronics and Design<\/i>, Aug 16-19, 1999.<\/li>\n
      16. J. Shor<\/strong>, V. Koifman and Y. Afek, \"Novel Method to Compensate for Resistor Non-Linearities and its Application to the Integration of Analog Functions on System-on-a-Chip IC's<\/a>\" 999 IEEE International Symposium on Circuits and Systems (ISCAS)<\/em>, 1999, pp. 294-297 vol.2.<\/li>\n
      17. Y. Salant, O. Norman, U. Dayan, N. Sivan, B. Perlman, N. Benayahu,, Y. Tsayeg, E. Zmora, J. Shor<\/strong>, E. Salamon, \u201cA Dual Core Engine for Embedded Applications\u201d in The Proceedings of the Ninth International Conference on Signal Processing Applications and Technology<\/i>, Sept 13-16, 1998.<\/li>\n
      18. E. Engel, M. Tarrab, Y. Amon, L. Belotserkovsky, E. Borowitz, D. Kuzmin, D. Moshe, E. Pisek and J. Shor<\/strong><\/b>, \u201c DSP56305 \u2013 Motorola New Optimized Single-Chip DSP for GSM Basestation Applications\u201d;, in The Proceedings of the International Conference on Signal Processing Applications and Technology<\/i>, 1996.<\/li>\n
      19. J. Shor<\/strong>, I. Grimberg, B.Z. Weiss, and A.D. Kurtz, \"Photoelectrochemical Etching of 6H-SiC\", Second International Symposium on Electrochemical Applications in Electronics, 183rd Electrochemical Society Conference<\/i>, Honolulu, Hawaii, May 16-21, 1993.<\/li>\n
      20. J.L. Davidson, J. Shor<\/strong><\/b>, D. Wur and A.D. Kurtz, \"Diamond Resistors Fabricated Monolithically on Diamond Film Substrates\",Third International Symposium on Diamond Materials, 183rd Electrochemical Society Conference<\/i>, Honolulu, Hawaii, May 16-21, 1993.<\/li>\n
      21. J. Shor<\/strong>, L. Bemis, A. D. Kurtz, M. F. Macmillan, W. J. Choyke, I. Grimberg and B. Z. Weiss, \"Characterization of the Microstructural and Optical Properties of Porous SiC\", Proceedings of the Fifth International Conference on SiC and Related Materials, Washington, DC, Nov. 1-3 1993.<\/li>\n
      22. L. Bemis, J. Shor <\/strong><\/b>and A. D. Kurtz, \"Monolithic Piezoresistive Stress Sensing Elements in 6H-SiC\", Proceedings of the Fifth International Conference on SiC and Related Materials<\/i>, Washington, DC, Nov. 1-3 1993.<\/li>\n
      23. J. Shor<\/strong>, R. S. Okojie, and A. D. Kurtz, \"Photoelectrochemical Etching and Etch-Stops in 6H-SiC\", Proceedings of the Fifth International Conference on SiC and Related Materials<\/i>, Washington, DC, Nov. 1-3 1993.<\/li>\n
      24. J. Shor<\/strong><\/b>, D. Goldstein, A.D. Kurtz and R.M. Osgood, Jr. , \"SiC Device Development for High Temperature Sensor Applications\", 1992 NASA High Temperature Measurement Conference Proceedings<\/i>, NASA Langley, Hampton, Va, April 12-13 1992, published in conference proceedings.<\/li>\n
      25. J. Shor<\/strong>, R.A. Weber, L.G. Provost, D. Goldstein, A.D. Kurtz, \"High Temperature Ohmic Contact Metallizations for n-type 3C-SiC Sensors\" in Wide Band-Gap Semiconductors<\/i> proceedings of the Fall, 1991 Materials Research Society Conference, Dec. 2-6, 1991, Boston, Mass. (Mat. Res. Soc. Press, Boston, Mass., 1992).<\/li>\n
      26. J. Shor<\/strong>, X.G. Zhang, R.M. Osgood, and A.D. Kurtz; \"Photoelectrochemical Etching and Dopant Selective Etch Stops in SiC\", in Amorphous and Crystalline SiC IV<\/i> ed. by C. Y. Yang, M. M. Rahman and G. L. Harris (Springer-Verlag, Berlin Heidelberg, 1992) p. 356.<\/li>\n
      27. J. Shor<\/strong>, D. Goldstein and A.D. Kurtz, \"Sensor Properties of n-type 3C-SiC\", in Amorphous and Crystalline SiC III<\/i>, Ed. by G. L. Harris, M. G. Spencer and C. Y. Yang (Springer Verlag, Berlin Heidelberg, 1992) p. 111.<\/li>\n
      28. J. Shor<\/strong>, X.G. Zhang, M.N. Ruberto and R.M. Osgood, \"Surface Micromachining of beta-SiC Using Laser-Assisted Photoelectrochemical Etching\", in Amorphous and Crystalline SiC III<\/i>, Ed. by G. L. Harris, M. G. Spencer and C. Y. Yang (Springer Verlag, Berlin Heidelberg, 1992) p. 191.<\/li>\n
      29. J. Shor<\/strong>, D. Goldstein and A.D. Kurtz, \"Evaluation of beta-SiC for Sensors\", in Proceedings of the 1991 International Conference on Solid State Sensors and Actuators<\/i> June 22-26, 1991, p. 912-915.<\/li>\n
      30. J. Shor<\/strong>, X.G. Zhang and R.M. Osgood, \"Photoelectrochemical Etching of beta-SiC\", Electrochemical Soc. Extended Abstracts 91-1<\/i>, May 1991.<\/li>\n
      31. X.G. Zhang, J. Shor<\/strong><\/b>, M.N. Ruberto, M.T. Schmidt, and R.M. Osgood, \"Laser Electrochemical Etching of SiC\", in The 1990 Proceedings of the State of the Art Program on Compound Semiconductors<\/i>, (Electrochemical Society Press, 1990).<\/li>\n
      32. J. Shor<\/strong>, D. Goldstein and A.D. Kurtz,\"Characterization of the Gauge Factor of n-type beta-SiC\", Electrochem. Soc. Extended Abstracts 90-1<\/i>, May 1990.<\/li>\n
      33. D. Goldstein, J. Shor<\/strong><\/b>\u00a0and A.D. Kurtz,\"TCR of n-type and n+<\/sup> beta-SiC\", Electrochemical Soc. Extended Abstracts 90-1<\/i>, May 1990.<\/li>\n<\/ol>\n

        DTTC (Design and Test Technology Conference) and ICTC (Intel Circuit Technology Conference) - (Refereed International Intel Conferences - <\/b>acceptance rate < 25%<\/b><\/i>)<\/b><\/p>\n

          \n
        1. K. Luria and J. Shor<\/strong>,<\/b> \"Frequency-based Digital Thermal Sensor\", presented at DTTC 2010 (Design and Test Technology Conference)<\/li>\n
        2. J. Shor<\/strong>, \"Analog DFT and DFM Circuits in Sandy Bridge\", presented at DTTC 2010<\/li>\n
        3. J. Shor<\/strong>, \"SFR Voltage Regulator for Low Noise PLL\u2019s with High Power Supply Rejection Ratio\", presented at DTTC 2007<\/li>\n
        4. K.Luria and J. Shor<\/strong><\/b>, \"Miniaturized CMOS Thermal Sensor Array for Measuring Hot Spots in Microprocessors\", presented at DTTC 2007<\/li>\n
        5. J. Shor<\/strong>, \"Low Noise Voltage Regulator Circuits for Low-Jitter PLL\u2019s\", presented at ICTC 2008 (International Circuit Technology Conference)<\/li>\n
        6. J. Shor<\/strong>, \"Learnings and advances of the SFR circuits for 1264 and 1266 processes\", presented at ICTC 2006<\/li>\n
        7. J. Shor<\/b>, \"Flicker Noise Effects on Analog Circuits in Intel Microprocessors\", published at DTTC 2007<\/li>\n
        8. J. Shor<\/b>, \"Voltage Regulator Architecture for Yonah PLL Power Supply\", published at DTTC 2004<\/li>\n<\/ol>\n

          Invited Publications and Presentations:<\/b><\/p>\n

            \n
          1. J. Shor<\/strong>, \u00a0\u201cDigital LDO or Analog LDO? You Decide!!\u201d \u2013 Presented at the Worshop of Energy Efficient Electronics, Ystad, Sweden (WEEE, 2017)<\/li>\n
          2. J. Shor<\/strong>, \"Compact Thermal Sensors in Intel Processors from 90nm to 22nm\", Columbia University Integrated Systems Labs, Special Seminar, Feb 2014.<\/li>\n
          3. J. Shor<\/strong>, \"Application of Wide Bandgap Semiconductors in High Temperature Microsensors\" presented at the National Academy of Sciences, Washington, DC, for the National Research Council, Committee on Materials for High Temperature Semiconductor Devices, Sept. 29, 1993 - results published in a report to determine funding policy.<\/li>\n
          4. Book Chapter<\/b>: J. Shor <\/strong>-<\/b> \"Electrochemical Etching of SiC\", in \"Properties of SiC\" ed. by G.L. Harris (IEE Press, EMIS Materials Science Series, 1995).<\/li>\n
          5. \"Making SiC Semiconductor Devices Containing Porous Regions\" , published in NASA Tech Briefs, Aug 1996, p. 88.<\/li>\n
          6. M.N. Ruberto, R. Scarmazzino, J. Shor<\/strong> <\/b>and R.M. Osgood; \"Microphotoelectrochemical Etching\", Presented at the Electrochemical Microfabrication Symposium, Electrochemical Soc. Conference<\/i>, Phoenix AZ, Oct. 13-18, 1991 and published in the conference proceedings.<\/li>\n
          7. J. Shor<\/strong>, \"Micromachining Methods for and Characterization of 6H-SiC Piezoresistive Sensing Elements\", given at Technion, IIT, Dept. of Mats. Eng., Jan 31, 1993.<\/li>\n<\/ol>\n","protected":false},"excerpt":{"rendered":"

            Journal Papers Google Citations\u00a0 A. Feldman and J. Shor, “A 0.0106 mm2 8nW Resistor-Less BJT Bandgap Reference Circuit in 65 nm CMOS With Orthogonal Voltage and Temperature Coefficient Trims,” in\u00a0IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 73, no. 1, pp. 60-72, Jan. 2026. Elisheva Berkowitz, Yosi Greenblatt, Claudio G. Jakobson, Adam Teman, … Continue reading Publications<\/span> →<\/span><\/a><\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"open","template":"","meta":{"footnotes":""},"class_list":["post-39","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/www.eng.biu.ac.il\/shorjos\/wp-json\/wp\/v2\/pages\/39"}],"collection":[{"href":"https:\/\/www.eng.biu.ac.il\/shorjos\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.eng.biu.ac.il\/shorjos\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.eng.biu.ac.il\/shorjos\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.eng.biu.ac.il\/shorjos\/wp-json\/wp\/v2\/comments?post=39"}],"version-history":[{"count":206,"href":"https:\/\/www.eng.biu.ac.il\/shorjos\/wp-json\/wp\/v2\/pages\/39\/revisions"}],"predecessor-version":[{"id":718,"href":"https:\/\/www.eng.biu.ac.il\/shorjos\/wp-json\/wp\/v2\/pages\/39\/revisions\/718"}],"wp:attachment":[{"href":"https:\/\/www.eng.biu.ac.il\/shorjos\/wp-json\/wp\/v2\/media?parent=39"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}